Ethernet is widely used in LAN Networks and Ethernet at 1-GB and 10-GB speeds is an attractive option for carriers operating in the MAN and WAN market segments. There was slow Ethernet market growth between 2001 and 2003, but in recent times the growth is phenomenal and has exceeded $20 billion.
Ethernet
is widely used in LAN Networks and Ethernet at 1-GB and 10-GB speeds
is an attractive option for carriers operating in the MAN and WAN
market segments. There was slow Ethernet market growth between 2001
and 2003, but in recent times the growth is phenomenal and has
exceeded $20 billion. According to the Research’s quarterly market
share and forecast service, the revenue from L2 and L3 Ethernet
switches is expected to cross $300 million.
10-GB
Ethernet has been developed to support a wide range of applications
in the enterprise network. It is basically used in the following
areas.
Switch-to-switch
links within the same wiring closet or data center or between
different buildings.
All
new desktops and laptops are now shipped with 10/100/1000BASE-T
ports.
10-Gigabit
Ethernet plays a key role in interconnecting the new generation of
high-performance servers
Automated
Solutions
A
growing business organization needs an efficient automated Ethernet
testing tool to aid in efficient network performance, which will
eventually improve ROI for the organization. Automated Ethernet
testing
is vital to provide high-speed network support. Automated Ethernet
network
testing
tools should cater to performance
testing
and check for conformances of complex IP networks, devices and
applications.
It
is imperative for organizations looking for Ethernet testing
solutions to make sure that the tool provides high levels of
flexibility and also be able to efficiently emulate network
functionality. A popular 10GE wire rate test solution, IxExplorer, is
commonly used in the market now. It is capable of generating,
capturing, characterizing and emulating network and application
traffic in order to establish definitive performance and conformance
metrics of the device under test.
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